HORIBA PR-PD3 Particle Scan Mask Semiconductor SOTW70069
HORIBA PR-PD3 Particle Scan Mask Semiconductor SOTW70069
$10,000
此金額純粹設備價格,不包含所有稅金、運費、拆裝測試費、平台服務費15%...等,皆為買方承擔。
This amount is the equipment price only and does not include taxes, shipping costs, disassembly and testing fees, platform service fees (15%), etc., all of which are to be defrayed by buyers.
Item Description
Condition of Equipment
Specification Attribute |
Specification Value |
Inspection object |
Particles on reticle/mask with or without pellicle |
Principle |
Laser scattering method |
Inspection time |
Approx. 7 min/2 surfaces (5 inch reticle), Approx. 7 min from inspection start (switch ON) to test result display for two surface (5 inchs) inspection * High throughput model specific to the glass/pellicle (approx. 4 min. for two surface inspection) is also available. |
Detectable particle size |
Pattern surface: 0.5 µm, Glass surface: 5.0 µm, Pellicle surface: 10.0 µm (* PSL equivalent) |
Reticle size |
5, 6 or 7 inch (Please specify when ordering.) |
Reticle cassette (Please specify when ordering) |
Applicable to the HORIBA standard cassette for 5, 6, 7 inches as well as stepper cases unique to individual maker for 5, 6 inches. (Single size of reticle and cassette handling is the standard. Contact us as to the multiple cassette handling system.) |
Inspection result |
Data mapping display on the FPD |
Dimensions |
Approx. 900 (W) x 1350 (D) x 1590 (H) mm Approx. 35.4 (W) x 53.1 (D) x 62.6 (H) in (Dimensions will vary depending on the reticle cassette specifications.) |
Utilities |
|
Installation site |
Clean room or clean booth, class 100 or better |
Temperature |
23 ±1°C |
Power |
100 to 230 V AC, 7.5 to 5 A, 50/60 Hz, single phase |
Vacuum source |
Pressure difference 8.0 x 104 Pa or more, 50 L/min |
Auction details
- Item No: SOTW70069
- Please let me know if you have any questions
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